Bruker AFM workshop

[Physics Front Desk]

Please join us for a workshop at the Ohio State University on Wednesday, September 26th and Thursday, September 27th.

In addition to the technical presentations outlined below, we will have the latest Bruker 3D metrology instruments, including the FastScan AFM, on hand for demonstrations and customer samples.

Please RSVP soon as space is limited; particularly for those wanting to run samples.

Best regards,

Matt

Bruker Nano Surface Metrology Workshop
Featuring Atomic Force and 3D Optical Microscopy
September 26th and 27th, 2012    9 AM - 5 PM

The Ohio State University, Physics Research Building
Click here for directions<http://www.osu.edu/map/building.php?building=070>

RSVP to Matthew.Thompson at bruker-nano.com<mailto:Matthew.Thompson at bruker-nano.com>

Agenda - Wednesday, September 26th

9:00 AM Continental Breakfast, Coffee & Refreshments
9:30 AM to Noon - Welcome & Technical Presentations

3D Optical Microscope: Surface Metrology at the Nanometer Level
Drew Griffin - Applications Scientist, Bruker Nano

Overview of Bruker Optical Profilers
Matthew Thompson - Bruker Nano

Advanced Surface Characterization Enhances Green Energy Technologies
John Thornton - Applications Scientist, Bruker Nano

Noon to 12:30 PM Light Lunch & Refreshments

12:30 PM to 1 PM - System Demonstration of the ContourGT-K1
Application scientists from Bruker will demonstrate use and applications of this new 3D Optical Profiler.

1 PM to 5 PM - Hands-on Sample Analysis with ContourGT-K1*
Application scientists from Bruker will be available for demonstrations and to provide guidance and training on your samples, time permitting.

*NOTE - If you would like to bring a sample for analysis please contact Drew Griffin (Drew.Griffin at bruker-nano.com<mailto:Drew.Griffin at bruker-nano.com>) to discuss and schedule a time


Agenda - Thursday, September 27th

9:00 AM Continental Breakfast, Coffee & Refreshments

9:30 AM to Noon - Welcome & Technical Presentations

An Introduction to Atomic Force Microscopy
John Thornton - Applications Expert, Bruker Nano

Recent Advances in Nano-electrical Characterization
Chunzeng Li, PhD- Development Scientist, Bruker Nano

Applications of Quantitative Electrical and Mechanical Characterization in Green Energy Research
Chunzeng Li, PhD- Development Scientist, Bruker Nano

Noon to 12:30 PM Light Lunch & Refreshments

12:30 PM to 1 PM - System Demonstration of the Dimension FastScan AFM
Application scientists from Bruker will demonstrate use and applications of this new Atomic Force Microscope.

1 PM to 5 PM - Hands-on Sample Analysis with Dimension FastScan AFM*       Application scientists from Bruker will be available for demonstrations and to provide guidance and training on your samples, time permitting.

*NOTE - If you would like to bring a sample for analysis please contact John Thornton (John.Thornton at Bruker-Nano.com<mailto:John.Thornton at Bruker-Nano.com>) to discuss and schedule a time.

Click on this link to see the Dimension FastScan(tm), the World's Fastest AFM, in Action!<http://www.youtube.com/watch?v=BjAapUBR2eE&list=UUN85BO-ZxR7Z7NBs6Pmu-7Q&index=15&feature=plcp>



Matt Thompson
Sales Manager - Mid-Atlantic and Ohio
Bruker Nano Surfaces Business
510 Fox Hollow Drive
Kennett Square, PA 19348
Phone: 610-742-1590
email: Matthew.Thompson at Bruker-Nano.Com<mailto:Matthew.Thompson at Bruker-Nano.Com>
internet: www.bruker.com<http://www.bruker.com>


Thanks,

Lisa Hommel, PhD
The Ohio State University
Dept. of Chemistry and Biochemistry
Surface Analysis & Mass Spec Lab Manager
Evans Lab 0081
(o) 614-292-2760
(c) 614-565-4640

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